ICRM 2009, 3-7 September 2007, Cape Town, South Africa
Applied Radiation and Isotopes 68 (7-8), 2010, pp. 1407-1412
Intercomparison of methods for coincidence summing corrections in gamma-ray spectrometry
M.-C. Lepy
Laboratoire National Henri Becquerel (LNE-LNHB), France
T. Altzitzoglou
Institute for Reference Materials and Measurements (IRMM), Belgium
M.J. Anagnostakis
National Technical University of Athens, Nuclear Engineering Department, School of Mechanical Engineering, Greece
D. Arnold
Physikalisch-Technische Bundesanstalt (PTB) Germany
M. Capogni
Istituto Nazionale di Metrologia delle Radiazioni Ionizzanti, ENEA, Italy
A. Ceccatelli
ISPESL, National Institute for Occupational Prevention and Safety, Department of Occupational Hygiene-Ionizing Radiation Laboratory, Italy
P. De Felice
Istituto Nazionale di Metrologia delle Radiazioni Ionizzanti, ENEA, Italy
R. Dersch
Physikalisch-Technische Bundesanstalt (PTB) Germany
P. Dryak
Czech Metrology Institute (CMI), Inspectorate for Ionizing Radiation (CMI), Czech Republic
A. Fazio
Istituto Nazionale di Metrologia delle Radiazioni Ionizzanti, ENEA, Italy
L. Ferreux
Laboratoire National Henri Becquerel (LNE-LNHB), France
M. Guardati
ISPESL, National Institute for Occupational Prevention and Safety, Department of Occupational Hygiene-Ionizing Radiation Laboratory, Italy
J.B. Han
Korea Research Institute of Standards and Science (KRISS), Republic of Korea
S. Hurtado
Universidad de Sevilla, Servicio de Radioisotopos, Spain
K.L. Karfopoulos
National Technical University of Athens, Nuclear Engineering Department, School of Mechanical Engineering, Greece
S. Klemola
Radiation and Nuclear Safety Authority (STUK), Radionuclide Analytics, Finland
P. Kovar
Czech Metrology Institute (CMI), Inspectorate for Ionizing Radiation (CMI), Czech Republic
K.B. Lee
Korea Research Institute of Standards and Science (KRISS), Republic of Korea
R. Ocone
Istituto Superiore per la Protezione e la Ricerca Ambientale, Dipartimento Nucleare, Rischio Tecnologico e Industriale Servizio Misure Radiometriche Settore Laboratorio, Italy
O. Ott
Physikalisch-Technische Bundesanstalt (PTB) Germany
O. Sima
Bucharest University, Physics Department, Romania
S. Sudar
University of Debrecen, Institute of Experimental Physics, Hungary
A. Svec
Slovak Institute of Metrology (SMU), Center for Ionizing Radiation, Slovak Republic
Chau Van Tao, Tran Thien Thanho
Vietnam National University Ho Chi Minh City, University of Science, Faculty of Physics, Department of Nuclear Physics, Vietnam
T. Vidmar
Institute for Reference Materials and Measurements (IRMM), Belgium
A comparison of the coincidence summing correction methods is
presented. Since there are several ways for computing these
corrections, each method has advantages and drawbacks that could be
compared. This part of the comparison was restricted to point
sources. The same experimental spectra, decay scheme and photon
emission intensities were used by all the participants. The results
were expressed as coincidence summing correction factors for several
energies of 152Eu and 134Cs, and three source-to-detector
distances. They are presented and discussed.